CVE-2026-82783 (GCVE-0-2026-82783)
Vulnerability from cvelistv5 – Published: 2026-09-14 06:42 – Updated: 2026-09-14 06:42
VLAI
EPSS
VEX
Summary
Plaintext storage of a password issue exists in CONPROSYS nano Series . If this vulnerability is exploited, an attacker with physical access to the product may obtain credentials.
Severity
4.2 (Medium)
CWE
- CWE-256 - Plaintext storage of a password
Assigner
References
2 references
Impacted products
3 products
| Vendor | Product | Version | CPE status | |
|---|---|---|---|---|
| Contec Co., Ltd. | Remote I/O Coupler Unit (Server Type) CPSN-MCB271-* |
Affected:
0 , < 1.82
(semver)
|
guessed | |
| Contec Co., Ltd. | Remote I/O Coupler Unit (EtherNet/IP Adapter) CPSN-EOB471EI-[]1 |
Affected:
0 , < 1.02
(semver)
|
guessed | |
| Contec Co., Ltd. | Programmable Remote I/O Coupler Unit (Software PLC Type) CPSN-PCB271-S1-041 |
Affected:
0 , < 1.61
(semver)
|
guessed |
{
"containers": {
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"product": "Remote I/O Coupler Unit (Server Type) CPSN-MCB271-*",
"vendor": "Contec Co., Ltd.",
"versions": [
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}
]
},
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"versions": [
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"status": "affected",
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}
]
},
{
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"vendor": "Contec Co., Ltd.",
"versions": [
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"status": "affected",
"version": "0",
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}
]
}
],
"descriptions": [
{
"lang": "en",
"value": "Plaintext storage of a password issue exists in CONPROSYS nano Series . If this vulnerability is exploited, an attacker with physical access to the product may obtain credentials."
}
],
"metrics": [
{
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"baseSeverity": "MEDIUM",
"vectorString": "CVSS:3.1/AV:P/AC:H/PR:N/UI:N/S:U/C:H/I:N/A:N",
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],
"problemTypes": [
{
"descriptions": [
{
"cweId": "CWE-256",
"description": "Plaintext storage of a password",
"lang": "en-US",
"type": "CWE"
}
]
}
],
"providerMetadata": {
"dateUpdated": "2026-09-14T06:42:57.965Z",
"orgId": "ede6fdc4-6654-4307-a26d-3331c018e2ce",
"shortName": "jpcert"
},
"references": [
{
"url": "https://www.contec.com/api/downloadlogger?download=/-/media/Contec/support/security-info/2026/contec_security_cps_26091000_en.pdf"
},
{
"url": "https://jvn.jp/en/vu/JVNVU96551518/"
}
]
}
},
"cveMetadata": {
"assignerOrgId": "ede6fdc4-6654-4307-a26d-3331c018e2ce",
"assignerShortName": "jpcert",
"cveId": "CVE-2026-82783",
"datePublished": "2026-09-14T06:42:57.965Z",
"dateReserved": "2026-08-31T02:30:58.278Z",
"dateUpdated": "2026-09-14T06:42:57.965Z",
"state": "PUBLISHED"
},
"dataType": "CVE_RECORD",
"dataVersion": "5.2",
"vulnerability-lookup:meta": {
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}
}
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Experimental. This forecast is provided for visualization only and may change without notice. Do not use it for operational decisions.
Forecast uses a logistic model when the trend is rising, or an exponential decay model when the trend is falling. Fitted via linearized least squares.
Sightings
| Author | Source | Type | Date | Other |
|---|
Nomenclature
- Seen: The vulnerability was mentioned, discussed, or observed by the user.
- Confirmed: The vulnerability has been validated from an analyst's perspective.
- Published Proof of Concept: A public proof of concept is available for this vulnerability.
- Exploited: The vulnerability was observed as exploited by the user who reported the sighting.
- Patched: The vulnerability was observed as successfully patched by the user who reported the sighting.
- Not exploited: The vulnerability was not observed as exploited by the user who reported the sighting.
- Not confirmed: The user expressed doubt about the validity of the vulnerability.
- Not patched: The vulnerability was not observed as successfully patched by the user who reported the sighting.
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The MITRE ATT&CK techniques below are AI-generated suggestions, inferred from the description of the
vulnerability by the CIRCL/vulnerability-attack-technique-classification-roberta-base
model, served locally by ML-Gateway.
They have not been verified by an analyst and are provided for guidance only.
The approach is described in our paper Mapping CVEs to MITRE ATT&CK Techniques: A Curated Gold-Set Classifier and the Limits of LLM-Assisted Label Expansion.
The approach is described in our paper Mapping CVEs to MITRE ATT&CK Techniques: A Curated Gold-Set Classifier and the Limits of LLM-Assisted Label Expansion.
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