CVE-2026-23790 (GCVE-0-2026-23790)
Vulnerability from cvelistv5 – Published: 2026-09-14 00:00 – Updated: 2026-09-14 01:03
VLAI
EPSS
VEX
Summary
An issue was discovered in DPU in Samsung Mobile Processor Exynos 1280, 2200, 1380, 1480, 2400, 1580, 2500, 1680, and 2600. A double-free vulnerability in the Samsung Exynos DPU driver (due to improper pointer management during DMA buffer reallocation) leads to kernel memory corruption and a potential use-after-free.
Severity
4.2 (Medium)
CWE
- CWE-415 - Double Free
Assigner
References
Impacted products
1 product
| Vendor | Product | Version | CPE status | |
|---|---|---|---|---|
| Samsung | Exynos 1280 firmware |
Affected:
0 , ≤ 2025-12-29
(custom)
cpe:2.3:a:samsung:exynos_1280_firmware:*:*:*:*:*:*:*:* |
{
"containers": {
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"defaultStatus": "unknown",
"product": "Exynos 1280 firmware",
"vendor": "Samsung",
"versions": [
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"lessThanOrEqual": "2025-12-29",
"status": "affected",
"version": "0",
"versionType": "custom"
}
]
}
],
"cpeApplicability": [
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"nodes": [
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"cpeMatch": [
{
"criteria": "cpe:2.3:a:samsung:exynos_1280_firmware:*:*:*:*:*:*:*:*",
"versionEndIncluding": "2025-12-29",
"vulnerable": true
}
],
"negate": false,
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]
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],
"descriptions": [
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}
],
"metrics": [
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"attackComplexity": "HIGH",
"attackVector": "LOCAL",
"availabilityImpact": "LOW",
"baseScore": 4.2,
"baseSeverity": "MEDIUM",
"confidentialityImpact": "NONE",
"integrityImpact": "LOW",
"privilegesRequired": "LOW",
"scope": "CHANGED",
"userInteraction": "NONE",
"vectorString": "CVSS:3.1/AV:L/AC:H/PR:L/UI:N/S:C/C:N/I:L/A:L",
"version": "3.1"
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"format": "CVSS",
"scenarios": [
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],
"problemTypes": [
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"descriptions": [
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"cweId": "CWE-415",
"description": "CWE-415 Double Free",
"lang": "en",
"type": "CWE"
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]
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"providerMetadata": {
"dateUpdated": "2026-09-14T01:03:31.962Z",
"orgId": "8254265b-2729-46b6-b9e3-3dfca2d5bfca",
"shortName": "mitre"
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"references": [
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"url": "https://semiconductor.samsung.com/support/quality-support/product-security-updates/"
},
{
"url": "https://semiconductor.samsung.com/support/quality-support/product-security-updates/cve-2026-23790/"
}
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"cveMetadata": {
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"cveId": "CVE-2026-23790",
"datePublished": "2026-09-14T00:00:00.000Z",
"dateReserved": "2026-01-16T00:00:00.000Z",
"dateUpdated": "2026-09-14T01:03:31.962Z",
"state": "PUBLISHED"
},
"dataType": "CVE_RECORD",
"dataVersion": "5.2",
"vulnerability-lookup:meta": {
"nvd": "{\"cve\":{\"id\":\"CVE-2026-23790\",\"sourceIdentifier\":\"cve@mitre.org\",\"published\":\"2026-09-14T02:17:13.537\",\"lastModified\":\"2026-09-14T02:17:13.537\",\"vulnStatus\":\"Received\",\"cveTags\":[],\"descriptions\":[{\"lang\":\"en\",\"value\":\"An issue was discovered in DPU in Samsung Mobile Processor Exynos 1280, 2200, 1380, 1480, 2400, 1580, 2500, 1680, and 2600. A double-free vulnerability in the Samsung Exynos DPU driver (due to improper pointer management during DMA buffer reallocation) leads to kernel memory corruption and a potential use-after-free.\"}],\"affected\":[{\"source\":\"cve@mitre.org\",\"affectedData\":[{\"vendor\":\"Samsung\",\"product\":\"Exynos 1280 firmware\",\"defaultStatus\":\"unknown\",\"versions\":[{\"version\":\"0\",\"lessThanOrEqual\":\"2025-12-29\",\"versionType\":\"custom\",\"status\":\"affected\"}]}]}],\"metrics\":{\"cvssMetricV31\":[{\"source\":\"cve@mitre.org\",\"type\":\"Secondary\",\"cvssData\":{\"version\":\"3.1\",\"vectorString\":\"CVSS:3.1/AV:L/AC:H/PR:L/UI:N/S:C/C:N/I:L/A:L\",\"baseScore\":4.2,\"baseSeverity\":\"MEDIUM\",\"attackVector\":\"LOCAL\",\"attackComplexity\":\"HIGH\",\"privilegesRequired\":\"LOW\",\"userInteraction\":\"NONE\",\"scope\":\"CHANGED\",\"confidentialityImpact\":\"NONE\",\"integrityImpact\":\"LOW\",\"availabilityImpact\":\"LOW\"},\"exploitabilityScore\":1.1,\"impactScore\":2.7}]},\"weaknesses\":[{\"source\":\"cve@mitre.org\",\"type\":\"Primary\",\"description\":[{\"lang\":\"en\",\"value\":\"CWE-415\"}]}],\"references\":[{\"url\":\"https://semiconductor.samsung.com/support/quality-support/product-security-updates/\",\"source\":\"cve@mitre.org\"},{\"url\":\"https://semiconductor.samsung.com/support/quality-support/product-security-updates/cve-2026-23790/\",\"source\":\"cve@mitre.org\"}]}}"
}
}
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Experimental. This forecast is provided for visualization only and may change without notice. Do not use it for operational decisions.
Forecast uses a logistic model when the trend is rising, or an exponential decay model when the trend is falling. Fitted via linearized least squares.
Sightings
| Author | Source | Type | Date | Other |
|---|
Nomenclature
- Seen: The vulnerability was mentioned, discussed, or observed by the user.
- Confirmed: The vulnerability has been validated from an analyst's perspective.
- Published Proof of Concept: A public proof of concept is available for this vulnerability.
- Exploited: The vulnerability was observed as exploited by the user who reported the sighting.
- Patched: The vulnerability was observed as successfully patched by the user who reported the sighting.
- Not exploited: The vulnerability was not observed as exploited by the user who reported the sighting.
- Not confirmed: The user expressed doubt about the validity of the vulnerability.
- Not patched: The vulnerability was not observed as successfully patched by the user who reported the sighting.
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The MITRE ATT&CK techniques below are AI-generated suggestions, inferred from the description of the
vulnerability by the CIRCL/vulnerability-attack-technique-classification-roberta-base
model, served locally by ML-Gateway.
They have not been verified by an analyst and are provided for guidance only.
The approach is described in our paper Mapping CVEs to MITRE ATT&CK Techniques: A Curated Gold-Set Classifier and the Limits of LLM-Assisted Label Expansion.
The approach is described in our paper Mapping CVEs to MITRE ATT&CK Techniques: A Curated Gold-Set Classifier and the Limits of LLM-Assisted Label Expansion.
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